- Title
- A new horizon in secondary neutral mass spectrometry: post-ionization using a VUV free electron laser
- Creator
- Veryovkin, Igor V.; Calaway, Wallis F.; Moore, Jerry F.; Pellin, Michael J.; Lewllen, John W.; Li, Yuelin; Milton, Stephen V.; King, Bruce V.; Petravic, Mladen
- Relation
- Applied Surface Science , p. 962-966
- Publisher Link
- http://dx.doi.org/10.1016/j.apsusc.2004.03.191
- Publisher
- Elsevier Science BV
- Resource Type
- journal article
- Date
- 2004
- Description
- A newnext term time-of-flight (TOF) mass spectrometer incorporating post-ionization of sputtered neutral species with tunable vacuum ultraviolet (VUV) light generated by previous termanext term free electron laser (FEL) has been developed. Capabilities of this instrument, called SPIRIT, were demonstrated by experiments with photoionization of sputtered neutral gold atoms with 125 nm light generated by the VUV FEL located at Argonne National Laboratory (ANL). In previous termanext term separate series of experiments with previous termanext term fixed wavelength VUV light source, previous termanext term 157 nm F2 laser, previous termanext term useful yield (atoms detected per atoms sputtered) of about 12% and previous termanext term mass resolution better than 1500 were demonstrated for molybdenum.
- Subject
- secondary neutral mass spectrometry; photoionization of atoms and molecules; laser desorption; free electron laser
- Identifier
- uon:2499
- Identifier
- http://hdl.handle.net/1959.13/29245
- Identifier
- ISSN:0169-4332
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